Measuring noise figure and y-factor
Patent 5191294 Issued on March 2, 1993. Estimated Expiration Date: 
July 21, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
July 21, 2012. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesSystem for setting reference reactance for vector corrected measurements Noise parameter determination method Noise parameter test method and apparatus Patent #: 4998071 InventorsAssigneeApplicationNo. 917909 filed on 07/21/1992US Classes:324/613, Noise324/638Scattering type parameters (e.g., complex reflection coefficient)ExaminersPrimary: Harvey, Jack B.Attorney, Agent or FirmInternational ClassG01R 027/06AbstractApparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise module includes, among other things, a pair of test ports for the DUT, a noise source which can be turned on or off by an external controller, a receiver, and a switch for coupling the output of the DUT to selectably either the receiver or port 2 of the VNA.Other References
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