U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Pyrometer apparatus and method

Patent 5188458 Issued on February 23, 1993. Estimated Expiration Date: Icon_subject September 9, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Radiation measurement of a product temperature in a furnace
Patent #: 4144758
Issued on: 03/20/1979
Inventor: Roney

Emissivity correction apparatus and method
Patent #: 4919542
Issued on: 04/24/1990
Inventor: Nulman, et al.

Method for measuring surface temperature of semiconductor wafer substrate, and heat-treating apparatus
Patent #: 4979134
Issued on: 12/18/1990
Inventor: Arima, et al.

Emissivity calibration apparatus and method
Patent #: 4989991
Issued on: 02/05/1991
Inventor: Pecot, et al.

Pyrometer apparatus and method
Patent #: 5061084
Issued on: 10/29/1991
Inventor: Thompson, et al.

Wafer heating and monitor module and method of operation
Patent #: 5098198
Issued on: 03/24/1992
Inventor: Nulman, et al.

Bichannel radiation detection method Patent #: 5114242
Issued on: 05/19/1992
Inventor: Gat, et al.

Inventors

Assignee

Application

No. 756536 filed on 09/09/1991

US Classes:

374/121, By thermally emitted radiation356/45, Plural color responsive374/127, Having significant frequency limitation or relationship (e.g., peak, ratio)374/128, Having significant signal handling circuitry (e.g., linearizing, emissivity compensation)374/133Ambient temperature compensated (e.g., dummy sensor)

Examiners

Primary: Cuchlinski, William A. Jr.
Assistant: Gutierrez, Diego

Attorney, Agent or Firm

Foreign Patent References

  • 0131523 JP 08/13/1983
  • 0167929 JP 10/13/1983
  • 0171643 JP 10/13/1983
  • 0253939 JP 12/13/1985
  • 0130834 JP 06/13/1986
  • 2082767 GB 03/13/1982

International Class

G01J 005/06

Abstract

Dual pyrometric detectors and method measure the temperature of a remote heated object in the presence of ambient radiation. One detector measures emitted radiation from both the remote object and from the environment, and the other detector measures radiation predominantly from the environment alone. The output signals from the two detectors are processed electronically to yield the detected radiation from the remote object alone. The result can then be electronically processed to display the pyrometrically-measured temperature of the remote object.

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