Bichannel radiation detection apparatus
Patent 5165796 Issued on November 24, 1992. Estimated Expiration Date: 
December 7, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 7, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesInventorsApplicationNo. 624205 filed on 12/07/1990US Classes:374/128, Having significant signal handling circuitry (e.g., linearizing, emissivity compensation)250/338.1, Infrared responsive250/339.04, Including temperature determining means374/126, Having emissivity compensating or specified radiating surface374/127, Having significant frequency limitation or relationship (e.g., peak, ratio)374/129Comparison with radiation reference standardExaminersPrimary: Cuchlinski, William A. Jr.Assistant: Gutierrez, Diego Attorney, Agent or FirmForeign Patent References
International ClassesG01J 005/62G01J 005/60 G01J / G01J 005/10 AbstractApparatus for optically determining the temperature of an object in an environment at elevated temperature provides enhanced measurement accuracy by sensing radiation from the object in two or more different wavebands of radiation. The information derived therefrom is cyclically sampled and processed to provide corrected emissivity of the object. The temperature of the object is accurately determined from the corrected emissivity and sensed radiation therefrom. The apparatus includes a radiation detector for receiving radiation during an interval, an optical filter structure with a plurality of optical filters of different radiation transmissive characteristics, and sampling circuits for receiving the radiation signal from the detector during a selected period within the interval during which radiation is supplied to the detector; wherein the selected period is shorter than the interval, is determined in response to the cyclic operation of the filter structure, and contains the least amlitude gradient.Other References
Field of SearchTHERMAL CALIBRATION SYSTEMEMISSIVITY DETERMINATION Having emissivity compensating or specified radiating surface Having significant signal handling circuitry (e.g., linearizing, emissivity compensation) Comparison with radiation reference standard Having significant frequency limitation or relationship (e.g., peak, ratio) Ambient temperature compensated (e.g., dummy sensor) Infrared responsive Plural color responsive | |
