U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Four memory state EEPROM

Patent 5159570 Issued on October 27, 1992. Estimated Expiration Date: Icon_subject May 7, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

High density vertically structured memory
Patent #: 4811067
Issued on: 03/07/1989
Inventor: Fitzgerald ,   et al.

Semiconductor memory device Patent #: 4907047
Issued on: 03/06/1990
Inventor: Kato, et al.

Inventors

Assignee

Application

No. 697228 filed on 05/07/1991

US Classes:

365/185.03, Multiple values (e.g., analog)257/315, With floating gate electrode257/321, With thin insulator region for charging or discharging floating electrode by quantum mechanical tunneling257/E21.209, Making electrode structure comprising conductor-insulator-conuctor-insulator-semiconductor, e.g., gate stack for non-volatile memory (EPO)257/E21.682, With source and drain on same level and without cell select transistor (EPO)257/E27.103, Electrically programmable ROM (EPO)257/E29.129, Gate electrodes for transistors with floating gate (EPO)257/E29.306, Hot carrier injection from channel (EPO)257/E29.308, Programmable with more than two possible different levels (EPO)365/182, Insulated gate devices365/185.26Floating electrode (e.g., source, control gate, drain)

Examiners

Primary: Fears, Terrell W.

Attorney, Agent or Firm

International Class

G11C 013/00

Abstract

An EEPROM memory cell having sidewall floating gates (28, 28a, 28b) is disclosed. Sidewall floating gates (28, 28a, 28b) are formed on sidewalls (30, 32) of a central block (22). Spaced apart bit lines (36, 36a, 36b) are formed to serve as memory cell sources and drains. Sidewall floating gates (28a, 28b) are capable of being programmed independently of one another. When control gate (18) is actuated and either bit line (36a) or bit line (36b) is used to read the device, four separate memory states may be identified depending on whether either, neither or both of the sidewall floating gates (28a, 28b) have been programmed.

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