Tri-state bus driver to support reconfigurable fault tolerant logic
Patent 5159273 Issued on October 27, 1992. Estimated Expiration Date: 
September 28, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
September 28, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesIntegrated circuit input-output diagnostic system Method and apparatus for testing three state drivers Patent #: 4841232 InventorsApplicationNo. 590413 filed on 09/28/1990US Classes:324/537, Of individual circuit component or element714/724Digital logic testingExaminersPrimary: Harvey, Jack B.Attorney, Agent or FirmInternational ClassG01R 031/02AbstractA three-state driver circuit including a first gating circuit responsive to a first enable signal for selectively gating an input signal to provide a first gated signal at an internal node, a second gating means responsive to a second enable signal and connected to the internal node for selectively gating the first gated signal so as to provide the output of the three-state bus driver, and a testing circuit for detecting or controlling the state of the internal node, and for providing a test output indicative of the inoperability of the first or second gating circuit. | |
