Wave front aberration measuring apparatus
Patent 5157459 Issued on October 20, 1992. Estimated Expiration Date: 
August 29, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
August 29, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesKeratometer Apparatus for maintaining adjustment of coincidence and relative phase relationship of light beams in an interferometer Apparatus for reading information Direct slope measurement shearing interferometer Patent #: 4660978 Inventors
AssigneeApplicationNo. 574071 filed on 08/29/1990US Classes:356/520Having shearingExaminersPrimary: Turner, Samuel A.Assistant: Kurtz, Richard Attorney, Agent or FirmForeign Patent References
International ClassG01B 009/02Foreign Application Priority Data1989-08-29 JPAbstractAn apparatus for measuring a wave front aberration including a light beam splitter for dividing a parallel laser light beam incident from a measuring object into two beam fluxes, an image rotator disposed in at least one optical path of the divided beam fluxes for rotating the wave from on the optical axis, an interference device for interfering, after superposing the beam fluxes, whose wave fronts are rotated relatively, an imaging lens for forming the interfered beam into an image, and an observation device for observing the imaged interference fringes.Other References
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