Method and apparatus for electro-optically measuring a voltage signal
September 19, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesApparatus and method for integrated circuit test analysis Method for testing and analyzing surface acoustic wave interdigital transducers High frequency test head using electro-optics Method for contactless testing of conducting paths in a substrate using photo-assisted tunneling Ultra-high-speed digital test system using electro-optic signal sampling Voltage detector using a sampling type high-speed photodetector Method for contactless testing of conducting paths in a substrate using photon-assisted tunneling Voltage detecting device Patent #: 5034683 InventorAssigneeApplicationNo. 585586 filed on 09/19/1990US Classes:324/753, Using electro-optic device324/74, TESTING AND CALIBRATING ELECTRIC METERS (E.G., WATT-HOUR METERS)324/96, Using radiant energy324/750System sensing fields adjacent device under test (DUT)ExaminersPrimary: Nguyen, Viet Q.Attorney, Agent or FirmInternational ClassG01R 019/00AbstractA method and apparatus for measuring an electro-optic voltage signal generated in response to an applied voltage signal at a select dot contact of an electro-optic crystal. The applied voltage signal is time averaged along one path to generate an average reference voltage signal, and electro-optically measured along another path to provide a corresponding electro-optic voltage signal. The electro-optic system is fine offset calibrated during a run, with the electro-optic voltage signal measured after the calibration. During the fine offset calibration, the electro-optic voltage signal and the average reference voltage signal are input to an integrator generating a responsive offset signal. The timing correlation between the applied voltage signal the electro-optic voltage signal is randomized during this calibration so that the generated electro-optic voltage signal is an average. The feedback forces the electro-optic signal to the average reference voltage signal level. Upon stabilization, the offset signal is locked in as the calibrated fine offset signal and the timing between the applied voltage and electro-optically measured voltage signals is restored. The applied voltage signal then is sampled to generate the electro-optically measured voltage signal.Other References
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