U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Stacked capacitor SRAM cell

Patent 5145799 Issued on September 8, 1992. Estimated Expiration Date: Icon_subject January 30, 2011. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Static memory having load polysilicon resistors formed over driver FET drains
Patent #: 4541006
Issued on: 09/10/1985
Inventor: Ariizumi ,   et al.

Static ram cell with trench pull-down transistors and buried-layer ground plate
Patent #: 4794561
Issued on: 12/27/1988
Inventor: Hsu

Semiconductor device sram to prevent out-diffusion
Patent #: 4803534
Issued on: 02/07/1989
Inventor: Koike ,   et al.

CMOS device with both p+ and n+ gates
Patent #: 4890141
Issued on: 12/26/1989
Inventor: Tang, et al.

Semiconductor device
Patent #: 4907057
Issued on: 03/06/1990
Inventor: Ariizumi, et al.

Multiple layer static random access memory device Patent #: 5001539
Issued on: 03/19/1991
Inventor: Inoue, et al.

Inventor

Assignee

Application

No. 647579 filed on 01/30/1991

US Classes:

438/153, Complementary field effect transistors257/E21.008, Of capacitor (EPO)257/E21.661, Static random access memory structures (SRAM) (EPO)438/210Including passive device (e.g., resistor, capacitor, etc.)

Examiners

Primary: Chaudhuri, Olik
Assistant: Trinh, Loc Q.

Attorney, Agent or Firm

Foreign Patent References

  • 0022057 JP 01/13/1989

International Classes

H01L 021/265
H01L 021/70

Abstract

This is an SRAM cell and the cell can comprise: two NMOS drive transistors; two PMOS load transistors; first and second bottom capacitor plates 50, 52, with the first plate 50 being over a gate 34 of one of the drive transistors and the second plate 52 being over a gate 40 of another of the drive transistors; a layer of dielectric material 68 over the first and second bottom capacitor plates; and first and second top capacitor plates 20, 26 over the dielectric layer, with the first top capacitor 20 plate forming a gate of one of the load transistors and with the second top capacitor plate 26 forming a gate of another of the load transistors, whereby the capacitor plates form two cross-coupled capacitors between the gates of the drive transistors and the stability of the cell is enhanced. This is also a method of forming an SRAM cell.

Other References

  • "New Poly-Si PMOS Load (PPL) SRAM Cell Having Excellent Soft Error Immunity", Yamanaka et al., IEDM 1988, pp. 48-51
  • "Influences on Soft Error Rates in Static Ram's", Carter et al., IEEE Journal of Solid State Circuits, vol SC-22, #3, 1987, pp. 430-43
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