U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Particle measurement method and apparatus for determining corrected particle diameter

Patent 5126581 Issued on June 30, 1992. Estimated Expiration Date: Icon_subject October 5, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3879129

Method of measuring concentration of substances
Patent #: 4828388
Issued on: 05/09/1989
Inventor: Namba

Method and apparatus to determine the size and velocity of particles using light scatter detection from confocal beams Patent #: 4854705
Issued on: 08/08/1989
Inventor: Bachalo

Inventors

Assignee

Application

No. 593108 filed on 10/05/1990

US Classes:

250/574, Scattered or reflected light356/336By particle light scattering

Examiners

Primary: Nelms, David C.

Attorney, Agent or Firm

International Class

G01N 015/06

Foreign Application Priority Data

1989-10-06 JP

Abstract

In a particle measurement method and apparatus, a laser beam is directed into a fluid and the intensity of light scattered by fine particles floating in the fluid is detected by a light receiving system to determine the particle diameter. A ratio of light scattering efficiency of the particles in the fluid to that in a standard fluid is determined on the base of the refractive index of the fluid in use. The particle diameter is corrected depending upon the ratio of light scattering efficiency by correcting a set value for discriminating the particle diameter or by correcting the intensity of the detected scattered light. This compensates for errors arising from the difference of the refractive index of the fluid containing the particle to be measured and assures a high accuracy in measuring the particle size.

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