U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Surface topography measurement apparatus and method

Patent 5125746 Issued on June 30, 1992. Estimated Expiration Date: Icon_subject June 7, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Arrangement for measuring depth based on lens focusing
Patent #: 4629324
Issued on: 12/16/1986
Inventor: Stern

Z-axis height measurement system
Patent #: 4743771
Issued on: 05/10/1988
Inventor: Sacks ,   et al.

Confocal measuring microscope with automatic focusing
Patent #: 4844617
Issued on: 07/04/1989
Inventor: Kelderman ,   et al.

Apparatus and method for automatically focusing an interference microscope
Patent #: 4931630
Issued on: 06/05/1990
Inventor: Cohen, et al.

Fine surface profile measuring apparatus Patent #: 4971445
Issued on: 11/20/1990
Inventor: Sato, et al.

Inventor

Application

No. 535017 filed on 06/07/1990

US Classes:

356/606, Line of light projected250/201.3, Of a microscope348/128Of surface (e.g., texture or smoothness, etc.)

Examiners

Primary: Evans, F. L.

Attorney, Agent or Firm

Foreign Patent References

  • 149815 JP 07/13/1986

International Class

G01B 011/24

Abstract

This patent describes a mechano-optical non-contact system, and method of use, for characterizing the topography of an area of a surface. The instrumentation consists of an optical system that illuminates a small region of the surface with a focused wedge of light at fixed angle, a magnification system to view the diffuse reflected profile image, a video camera that provides electrical signals corresponding to the profile image, a three dimensional, computer controlled motorized stage, a means for automatically focusing each region of the surface with respect to the optical system, and a computer to analyze and operate on the signal, and record the primary topographical data. The primary data obtained, from which all other parameters derive, are the heights, over an area, as a function of their x,y coordinates in a reference plane (i.e. z(x,y)). The system automatically measures the coordinates of points on the surface, at equally spaced intervals, along profiles that can be many times the optical field. Coordinate data for an area are obtained by measuring the coordinates along close and equally spaced profiles within the region.

PatentsPlus Images
Enhanced PDF formats
loading...
PatentsPlus: add to cart
PatentsPlus: add to cartSearch-enhanced full patent PDF image
$9.95more info
PatentsPlus: add to cart
PatentsPlus: add to cartIntelligent turbocharged patent PDFs with marked up images
$18.95more info
 
Sign InRegister
Username  
Password   
forgot password?