U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Electrical component package comprising polymer-reinforced solder bump interconnection

Patent 5120678 Issued on June 9, 1992. Estimated Expiration Date: Icon_subject November 5, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Solder interconnection structure for joining semiconductor devices to substrates that have improved fatigue life, and process for making
Patent #: 4604644
Issued on: 08/05/1986
Inventor: Beckham ,   et al.

Shaped solder pad for reflow soldering of surface mounting cylindrical devices on a circuit board
Patent #: 4605153
Issued on: 08/12/1986
Inventor: Van Den Brekel ,   et al.

Semiconductor resin package structure Patent #: 4825284
Issued on: 04/25/1989
Inventor: Soga ,   et al.

Inventors

Application

No. 609483 filed on 11/05/1990

US Classes:

29/840, By metal fusion29/841, With encapsulating, e.g., potting, etc.228/175, Plural diverse bonding228/180.22, Lead-less (or "bumped") device257/E21.505, Insulative mounting semiconductor device on support (EPO)257/E23.069, Spherical bumps on substrate for external connection, e.g., ball grid arrays (BGA) (EPO)438/125Insulative housing or support

Examiners

Primary: Chaudhuri, Olik
Assistant: Griffis, Andrew

Attorney, Agent or Firm

Foreign Patent References

  • 23534 EP 11/13/1981
  • 52-31673 JP 03/13/1977
  • 55-117254 JP 09/13/1980
  • 63-239826 JP 10/13/1988
  • 1-170027 JP 07/13/1989

International Class

H01L 021/56

Abstract

An improved method is provided for assembling an integrated circuit component to a substrate by a solder bump interconnection that is reinforced by a polymer film. The component is attached to a region of the substrate by a plurality of solder bump interconnections that create a gap between the component interface and the substrate region. A polymer dam is applied to the region encircling the attached component spaced apart therefrom. A liquid polymer precursor material is applied to the region including the gap and is confined by the dam to prevent indiscriminate flow across the substrate. In one aspect of this invention, gas is vented from the gap through a passage in the substrate to enhance fill by the precursor liquid. In another aspect of this invention, the precursor liquid is injected into the gap through a passage in the substrate and spread outwardly therefrom. In any event, the precursor liquid infiltrates the gap about the solder interconnections and is cured to form a film that reinforces and protectively encapsulates the solder interconnections.

Other References

  • Nakano, F. et al., "Resin-Insertion Effect on Thermal Cycle Resistivity of Fkip-Chip Mounted LSI Devices", ISHM '87 Proceedings, pp. 536-54
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