Surface contamination detection using infrared-transparent fibers or attenuated total reflection crystals
Patent 5097129 Issued on March 17, 1992. Estimated Expiration Date: 
December 6, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 6, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3515490 Infra-red analysis apparatus and method Environmental conditioning and safety system for disk-type mass memories Internal reflection spectroscopy for deep container immersion Patent #: 4835389 InventorsApplicationNo. 623636 filed on 12/06/1990US Classes:250/338.1, Infrared responsive250/227.14, Condition responsive light guide (e.g., light guide is physically affected by parameter sensed which results in light conveyed to the photocell)250/227.18, Causing light spectral frequency/wavelength change250/227.19, With coherent interferrometric light250/339.07, Including spectrometer or spectrophotometer250/339.11, Measuring infrared radiation reflected from sample250/341.8, Measuring infrared radiation reflected from sample360/97.03Plural disksExaminersPrimary: Hannaher, ConstantineAttorney, Agent or FirmForeign Patent References
International ClassG01N 021/90AbstractAirborne contaminants within a substantially sealed enclosure are detected and measured, in situ, without interrupting the operation of moving parts within the enclosure. At least one infrared (IR)-transparent attenuated total reflection (ATR) element, such as an optical fiber, optical fiber bundle, or ATR crystal, is disposed in the enclosure to collect or react with contaminants. An IR source is optically coupled to one part of the element, and an IR detector is optically coupled to another part of the element. The source and detector, in combination, respond to changes in intensity at the wavelengths of the IR radiation transmitted by the element to identify the contaminants and quantities thereof that settle on the element or compounds that have formed thereon. The source may be a continuous source (such as a black body) and the detector an IR spectrometer. Or, the source may be a diode laser and the detector an IR radiation detector. The sealed enclosure may be the housing of a head-disk assembly of a disk file.Atlernatively, the apparatus may include an IR-transparent ATR element disposed within the housing and an IR spectrometer optically coupled to a radiation output surface of the element for sensing emission emerging from the element. One end of the element may be reflection coated to increase the radiation output.Other References
Field of SearchCausing light spectral frequency/wavelength changeWith coherent interferrometric light Condition responsive light guide (e.g., light guide is physically affected by parameter sensed which results in light conveyed to the photocell) Infrared responsive BY DISPERSED LIGHT SPECTROSCOPY Refractive rod engages specimen Environmental control (e.g., air filter, temperature control) Plural disks Flexible disk | |
