Electro-optic sampling system clock and stimulus pattern generator
Patent 5095262 Issued on March 10, 1992. Estimated Expiration Date: 
March 10, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
March 10, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2451480 3436651 3512092 3582812 3701027 Frequency synthesizer Measurement of electrical signals with picosecond resolution Measurement of electrical signals with subpicosecond resolution High speed testing of electronic circuits by electro-optic sampling High frequency test head using electro-optics InventorsApplicationNo. 240017 filed on 09/01/1988US Classes:324/73.1, PLURAL, AUTOMATICALLY SEQUENTIAL TESTS324/753, Using electro-optic device714/744Clock or synchronizationExaminersPrimary: Wieder, Kenneth A.Assistant: Nguyen, Viet Q. Attorney, Agent or FirmInternational ClassG01R 031/00AbstractA high-speed electro-optic test system for testing high-speed electronic devices and integrated circuits is provided with a precision programmable reference clock source providing clock pulses for accurately timing a stimulus pattern in precise synchronism with optical sampling pulses. The clock source includes a frequency synthesizer having a programmed output frequency and precision delay features. The stimulus pattern clock frequency and pattern length can be programmed to facilitate maximum throughput for devices being tested in the electro-optic system. | |
