U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Process for making semiconductor-on-insulator device interconnects

Patent 5066613 Issued on November 19, 1991. Estimated Expiration Date: Icon_subject July 13, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

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Inventors

Application

No. 380175 filed on 07/13/1989

US Classes:

438/155, And additional electrical device on insulating substrate or layer257/E21.593, By forming silicide of refractory metal (EPO)257/E21.704, Substrate is nonsemiconductor body, e.g., insulating body (EPO)257/E23.016, For devices consisting of semiconductor layers on insulating or semi-insulating substrates, e.g., silicon on sapphire devices, i.e., SOS (EPO)438/154Complementary field effect transistors

Examiners

Primary: Hearn, Brian E.
Assistant: Nguyen, Tan T.

Attorney, Agent or Firm

Foreign Patent References

  • 0226957 JP. 10/13/1986

International Class

H01L 021/283

Abstract

A process for developing conductive interconnect regions between integrated circuit semiconductor devices formed on an insulating substrate utilizes the semiconductor material itself for formation of device interconnect regions.A patterned layer of semiconductor material is formed directly on the surface of an insulating substrate. The patterned layer includes regions where semiconductor devices are to be formed and regions which are to be used to interconnect terminals of predetermined ones of the semiconductor devices. After forming the semiconductor devices in selected regions of the semiconductor material, the regions of the semiconductor material patterned for becoming interconnects are converted to a metallic compound of the semiconductor material.

Other References

  • Reedy et al., "Thin (100 nm) SOS for Application to Beyond VLSI Microelecnics", Mat. Res. Soc. Symp. Proc., vol. 107, 198
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