U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Apparatus for inspecting both sides of tape or sheet

Patent 5061074 Issued on October 29, 1991. Estimated Expiration Date: Icon_subject October 17, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3421806

3752589

3900244

Transmitted light and/or incident light inverse microscope
Patent #: 4619503
Issued on: 10/28/1986
Inventor: Reinheimer ,   et al.

Heat dissipating interconnect tape for use in tape automated bonding Patent #: 4827376
Issued on: 05/02/1989
Inventor: Voss

Inventors

Assignee

Application

No. 422491 filed on 10/17/1989

US Classes:

356/390, With two images of single article compared359/372, With plural optical axes359/376Stereoscopic

Examiners

Primary: Rosenberger, Richard A.

Attorney, Agent or Firm

Foreign Patent References

  • 3323836 DE 01/13/1985

International Class

G02B 027/02

Foreign Application Priority Data

1988-10-17 JP

Abstract

An apparatus for inspecting the top and bottom surfaces of a tape or sheet has a device to magnify the surface of the tape or sheet, with its objective lens disposed to face the top surface of the tape or sheet. The apparatus also has an optical transmittion system that transmits an image of the bottom surface of the tape or sheet through a focusing unit and four reflectors, each of which is adapted to bend the path of light rays 90 degrees. Of the four reflectors, one that faces the objective lens is retractable from the light-ray path in the optical transmission system. The reflector facing the objective lens may be a half-coated mirror. Fixed in the light-ray path in the optical transmission system, the half-coated mirror is not retractable.

Other References

  • Jackson et al., "Dual Microscope System", IBM Technical Disclosure Bulletin, vol. 21, No. 8 (Jan. 1979), pp. 3129-313
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