Integrated circuit interface
Pressure control apparatus for use in an integrated circuit testing station
Test fixture capable of electrically testing an integrated circuit die having a planar array of contacts
Multiple lead probe for integrated circuits in wafer form Patent #: 4912399
ApplicationNo. 548401 filed on 07/05/1990
US Classes:324/754, With probe elements324/762Cantilever
ExaminersPrimary: Wieder, Kenneth A.
Assistant: Nguyen, Viet Q.
Attorney, Agent or Firm
Foreign Patent References
International ClassG01R 031/02
Foreign Application Priority Data1989-10-02 JP
AbstractProbe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable. The disclosure refers to additional devices to enhance the convenience in determining the alignment between the probe front ends and the IC ends, and also in obtaining accurate measurements of an IC chip under test.