Quasi volume diffracting structures
Patent 5048925 Issued on September 17, 1991. Estimated Expiration Date: 
September 17, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
September 17, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3482107 Device for measuring light incident on an image forming optical system Patent #: 4103153 InventorsAssigneeApplicationNo. 193134 filed on 04/29/1988US Classes:359/569, Including particular grating characteristic359/566, From grating359/593Plural members in seriesExaminersPrimary: Dzierzynski, Paul M.Assistant: Phan, James Attorney, Agent or FirmForeign Patent References
International ClassesG02B 005/18G02B 017/00 AbstractA structure for responding to incident radiation for directing said radiation in a selected direction with respect to the structure, the structure using at least two outer diffraction elements and an intermediate diffraction element, the diffraction characteristics being selected so that the selected direction remains within relatively limited confines independent of the angles of incidence of the incoming radiation over a selected range thereof.Other References
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