U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Measurement of size and refractive index of particles using the complex forward-scattered electromagnetic field

Patent 5037202 Issued on August 6, 1991. Estimated Expiration Date: Icon_subject July 2, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Automated method for cell volume determination
Patent #: 4284355
Issued on: 08/18/1981
Inventor: Hansen ,   et al.

Interferometric measurement apparatus and method having increased measuring range
Patent #: 4358201
Issued on: 11/09/1982
Inventor: Makosch

Surface condition measurement apparatus
Patent #: 4650330
Issued on: 03/17/1987
Inventor: Fujita

Measuring vibrational frequency of vibratable pins Patent #: 4850225
Issued on: 07/25/1989
Inventor: Chen ,   et al.

Inventors

Application

No. 547735 filed on 07/02/1990

US Classes:

356/336, By particle light scattering356/335, FOR SIZE OF PARTICLES356/338, With photocell detection356/364, BY POLARIZED LIGHT EXAMINATION356/484, Having light beams of different frequencies (e.g., heterodyning)356/517For refractive indexing

Examiners

Primary: Rosenberger, Richard A.
Assistant: Pham, Hoa Q.

Attorney, Agent or Firm

International Class

G01N 015/02

Abstract

An apparatus is described for classifying particles and includes an optical system for transmitting to a focal plane which includes at least one particle, two substantially parallel optical beams, the beams being initially mutually coherent but of different polarizations. The beams are displaced and focused in the focal plane. A further optical system is positioned in the path which the beam takes after depating from the focal plane and combines the beams so that a particle-induced phase shift in one beam is manifest by a change in elliptical polarization of the combined beams. A first detector is responsive to the beam's intensity along a first polarization axis to produce a first output and a second detector is responsive to the beams intensity along a second polarization axis to produce a second output. The first and second outputs are added to provide an extinction signal and, in a separate device, are subtracted to provide to phase shift signal. The extinction signal and phase shift signal are both fed to a processor which classifies a particle in accordance therewith.

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