Apparatus and methods of producing an optimal high intensity x-ray beam
Patent 5029195 Issued on July 2, 1991. Estimated Expiration Date: 
August 7, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
August 7, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 805795 1865441 2075146 2497543 2497755 3376415 3751701 X-ray tube X-ray source assembly Method and apparatus incorporating no moving parts, for producing and selectively directing x-rays to different points on an object InventorApplicationNo. 391698 filed on 08/07/1989US Classes:378/121, Electron tube378/137, With electron scanning or deflecting means378/138With electron focusing or intensity control meansExaminersPrimary: Church, Craig E.Attorney, Agent or FirmInternational ClassH01J 035/30AbstractApparatus and method for deriving an x-ray beam from an electron beam striking an anode at a selected angle, the x-ray beam being selectively directed to achieve optimal high intensity yield of high energy bremsstrahlung photons for a given x-ray beam cross-section. The angle of the x-ray beam relative to the anode is selected (1) to prevent anode damage and (2) to minimize undesired multiple scatter, and (3) maximize high energy photon production in the bremsstrahlung spectrum. The angles of the incident electron beam and of the emitted x-ray beam and the angle of the planes normal to the anode surface and containing the electron beam and x-ray beam, respectively, are defined to account for multiple scattering and out-scattering of electrons as well as enhanced x-ray beam intensity, and angular distribution of emitted photons of a desired energy.Other References
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