Apparatus for the optical detection of flaws, in particular cracks in transparent objects

Patent 5020908 Issued on June 4, 1991. Estimated Expiration Date:

March 30, 2010. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Abstract Claims Description Full Text

Patent References

Mold identification
Patent #: 4201338
Issued on: 05/06/1980
Inventor: Keller

Method and apparatus for optically detecting defects in a transparent object
Patent #: 4208130
Issued on: 06/17/1980
Inventor: Saconney , et al.

Method and apparatus for inspecting transparent objects Patent #: 4293219
Issued on: 10/06/1981
Inventor: Ducloux

Inventor

Hermann, Peter

Application

No. 503131 filed on 03/30/1990

US Classes:

356/239.1, Transparent or translucent material250/223B, Bottles356/239.4Containers (e.g., bottles)

Examiners

Primary: Turner, Samuel A.

Attorney, Agent or Firm

Marks, Murase & White

Foreign Patent References

0061021 EP. 03/13/1981
2940122 DE. 10/13/1978
8103706 DE. 06/13/1981
2378276 FR. 01/13/1977
2432342 FR. 08/13/1978

International Class

G01N 021/90

Foreign Application Priority Data

1985-11-15 EP

Abstract

An apparatus for the optical detection of cracks in transparent objects having several radiation sources and several groups of detectors which each have eight detectors. Each radiation impulse from one or more radiation sources may impinge on one or more groups of detectors and form an electro-optical channel independent of the others. The channels are switched on and off periodically one after the other. The sensitivity level of each group of detectors is individually programmable. The groups of detectors and the radiation sources are mounted on a stand so that they may be adjusted having a frame with holders. Light scattering is minimized by fitting the groups of detectors with shields. Such an apparatus can be relatively simply set up and adjusted and be simplified as a result of the separation of the electro-optical channels. The electronic switching permits a rapid, safe and automatic detection of flaws when a suitable microprocessor is employed.