Patent ReferencesSystem and method for pattern recognition Vision inspection system Patent #: 4581762 InventorsAssigneeApplicationNo. 237935 filed on 08/29/1988US Classes:382/103, Target tracking or detecting342/62, Missile or spacecraft guidance342/64, With map matching348/26, Contour generator382/199, Pattern boundary and edge measurements382/216, At multiple image orientations or positions382/217, Electronic template382/272Based on a local average, mean, or medianExaminersPrimary: Moore, David K.Assistant: Santos, Daniel Attorney, Agent or FirmInternational ClassG06K 009/00AbstractA method of aligning two images of the same scene by matching features in a first image to features in a second image is disclosed. The method comprises identifying edges of objects in the first image using two different processes. The edges identified using both processes are compared and combined into one image representing confirmed edges which are readily identified in other images of the same scene. A template is then formed from the confirmed edges which is matched to a subregion of the second image. | |