Method and apparatus for checksum address generation in a fail-safe modular memory
Patent 5007053 Issued on April 9, 1991. Estimated Expiration Date: 
November 30, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
November 30, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesMemory checking method Method for detecting intermittent error in volatile memory Fail safe architecture for a computer system Memory integrity checking system for a gaming device Self-testing memory Data terminal with capability of checking memory storage capacity as well as program execution parameters Patent #: 4807186 InventorsApplicationNo. 278104 filed on 11/30/1988US Classes:714/718, Memory testing714/6, Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data)714/722Performing arithmetic function on memory contentsExaminersPrimary: Fleming, Michael R.Attorney, Agent or FirmInternational ClassG06F 011/10AbstractA modular fail-safe memory and an address generation mechanism that provides load balancing when the memory is shared by a number of processors. A plurality of memory modules are used for the memory with no specific limit on the number of memory modules, and a checksum block is used to back-up corresponding blocks in the other memory modules. The checksum blocks are distributed across the memory modules, and an address generation mechanism determines the checksum location for a specific memory block. This address generation mechanism ensures that checksum blocks are equally divided between the memory modules so that there is no memory bottleneck, is easy to implement in hardware, and is extended to provide similar properties when a module failure occurs.Other References
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