U.S. patents available from 1976 to present.
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High capacity multiple-disk storage method and apparatus having unusually high fault tolerance level and high bandpass

Patent 4958351 Issued on September 18, 1990. Estimated Expiration Date: Icon_subject April 1, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Schmitt trigger circuit
Patent #: 4719367
Issued on: 01/12/1988
Inventor: Denda

High capacity disk storage system having unusually high fault tolerance level and bandpass
Patent #: 4722085
Issued on: 01/26/1988
Inventor: Flora ,   et al.

Cache error code update
Patent #: 4768197
Issued on: 08/30/1988
Inventor: Petolino ,   et al.

Buffer error retry
Patent #: 4791642
Issued on: 12/13/1988
Inventor: Taylor ,   et al.

Method of recording in a disk memory and disk memory system Patent #: 4817035
Issued on: 03/28/1989
Inventor: Timsit

Inventors

Assignee

Application

No. 176480 filed on 04/01/1988

US Classes:

714/770, Disk array714/718Memory testing

Examiners

Primary: Fleming, Michael R.

Attorney, Agent or Firm

International Class

G06F 011/10

Abstract

A multiplicity of independently operating disk drive subsystems are coupled to a read/write interface containing error circuitry and data organizer circuitry. The data organizer circuitry organizes read/write data for read/write communication with the disk drive subsystems via the error circuitry such that the overall system appears as a large, high capacity disk drive system having an unusually high fault tolerance and a very high bandpass. Caching is additionally provided in the read/write interface in a manner which takes advantage of the organization provided by the data organizer to significantly improve overall performance. Advantage is also taken of the conventionally provided error detection capability of each disk drive subsystem to enhance the capability of the error circuitry.

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