Apparatus and method for the examination of properties of an object
Patent 4906931 Issued on March 6, 1990. Estimated Expiration Date: 
October 11, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
October 11, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3774103 Nuclear magnetic resonance methods and apparatus Patent #: 4587488 InventorAssigneeApplicationNo. 255233 filed on 10/11/1988US Classes:324/309To obtain localized resonance within a sampleExaminersPrimary: Tokar, MichaelAttorney, Agent or FirmForeign Patent References
International ClassG01R 033/20Foreign Application Priority Data1987-10-08 FIAbstractThe invention relates to an apparatus for the examination of an object by the application of methods, such as magnetic imaging, based on nuclear magnetic resonance. The apparatus includes means for creating a first magnetic field over an object to be examined as well as means for creating and registering a nuclear magnetic resonance signal. The apparatus further includes means for creating a second magnetic field in a manner that the formation of nuclear magnetization occurring between successive excitation and signal pick-up events is at least partially effected while the second magnetic field is switched on. | |
