Optical profile measuring apparatus
Patent 4906098 Issued on March 6, 1990. Estimated Expiration Date: 
May 9, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
May 9, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3765774 3791741 3796492 3858983 3895870 3905705 3918816 Apparatus for producing a scanning laser beam of constant linear velocity Light beam shape control in optical measuring apparatus Method and apparatus for measuring a dimension of an object in a defined space by scanning with a light beam InventorsAssigneeApplicationNo. 192584 filed on 05/09/1988US Classes:356/612, By specular reflection209/525, Sizing with visible light beam250/223B, Bottles250/559.22, Profile356/239.4, Containers (e.g., bottles)356/394, With comparison to master, desired shape, or reference voltage356/398, With object being compared and light beam moved relative to each other (e.g., scanning)356/428, Of containers356/638Shadow or beam blockingExaminersPrimary: Evans, F. L.Attorney, Agent or FirmInternational ClassesG01B 011/24G01B 011/10 AbstractAn apparatus for measuring the profile of portions of an article located within a predefined plane. Each portion is scanned, such as by an optical micrometer providing a beam of radiant energy, to determine its dimension. The distance between each portion and a vertical reference is also scanned to determine its dimension. The article is rotated about an axis intersecting the predefined plane within the scan of the beam and is axially moved along an axis parallel to the intersecting axis within the scan of the beam so that the dimension of each portion and its distance from the vertical reference can be determined. The apparatus may be used in combination with a cavity identification system to control manufacturing employing multiple molds. | |
