U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Noise parameter determination method

Patent 4905308 Issued on February 27, 1990. Estimated Expiration Date: Icon_subject April 5, 2009. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2901696

3619780

Signal analyzer with noise estimation and signal to noise readout
Patent #: 4074201
Issued on: 02/14/1978
Inventor: Lennon

Radio receiver alignment indicator
Patent #: 4232398
Issued on: 11/04/1980
Inventor: Gould ,   et al.

Apparatus for measuring noise factor and available gain Patent #: 4491783
Issued on: 01/01/1985
Inventor: Sawayama ,   et al.

Inventor

Assignee

Application

No. 333633 filed on 04/05/1989

US Classes:

455/226.1, Measuring or testing of receiver324/613, Noise455/67.13Noise, distortion, or unwanted signal detection (e.g., quality control, etc.)

Examiners

Primary: Eisenzopf, Reinhard J.
Assistant: Solis, Jose M.

Attorney, Agent or Firm

International Classes

G01S 007/40
G01R 027/28

Abstract

A method of determining a receiver's noise parameters by measuring one noise power for a first source noise temperature and a plurality of noise powers for another source noise temperature, all at known different source reflection coefficients.

Other References

  • "IRE Standards on Methods of Measuring Noise in Linear Twoports, 1959," Proceedings of the IRE, (Jan. 1960), pp. 60-68
  • Lane, Richard P., "Determination of Device Noise Parameters," Proceedings of the IEEE, vol. 57, (Aug. 1969), pp. 1461-1462
  • Adamian and Uhlir, "Simplified Noise Evaluation of Microwave Receivers," IEEE Transaction on Instrumentation and Measurement, vol. IM-22, No. 2, (Jun. 1973), pp. 181-18
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