U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

System employing preconditioned radiation for detecting defects in transparent objects

Patent 4900916 Issued on February 13, 1990. Estimated Expiration Date: Icon_subject March 2, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

Mold identification
Patent #: 4201338
Issued on: 05/06/1980
Inventor: Keller

Method and apparatus of cavity identification of mold of origin of a glass container
Patent #: 4230266
Issued on: 10/28/1980
Inventor: Juvinall

Apparatus for detecting faults in transparent objects
Patent #: 4547067
Issued on: 10/15/1985
Inventor: Watanabe

System for detecting selective refractive defects in transparent articles
Patent #: 4606634
Issued on: 08/19/1986
Inventor: Bieringer

System for detecting selective refractive defects in transparent articles
Patent #: 4610542
Issued on: 09/09/1986
Inventor: Ringlien

Bottle sidewall defect detector employing masking means Patent #: 4682023
Issued on: 07/21/1987
Inventor: Yoshida

Inventor

Assignee

Application

No. 163277 filed on 03/02/1988

US Classes:

250/223B, Bottles356/239.4Containers (e.g., bottles)

Examiners

Primary: Nelms, David C.
Assistant: Sharmi, Khaled

Attorney, Agent or Firm

International Class

G01N 009/04

Abstract

An apparatus and method for inspecting transparent objects is disclosed. The apparatus employs preconditioned radiation to detect defects having small radii of curvature or other such highly refractive surfaces and discriminate them from desirable markings having larger radii of curvature. The apparatus comprises a radiation source, means for selecting angular spectrum ranges, means for modifying average angles of incidence, radiation detection means and processing means.

Other References

  • R. Cormack et al., "Optical and Digital Pattern Recognition", Proceedings of the SPIE-The International Society for Optical Engineering, vol. 754, Jan. 13-15, 1987, Los Angeles, Cali
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