Patent References 3373869 3532887 3754146 3783296 Apparatus for detecting irregularities in the surfaces of materials Diffraction pattern amplitude analysis for use in fabric inspection Calibration standard for infrared absorption gauge Method of simultaneously determining gauge and orientation of polymer films Patent #: 4631408 InventorAssigneeApplicationNo. 029805 filed on 03/25/1987US Classes:250/359.1, Rectilinearly moving object250/339.06, With radiation source250/339.1, Determining moisture content250/341.1, With irradiation or heating of object or material250/347, With movable beam deflector or focussing means250/559.06, With scanning356/431Including transverse scanningExaminersPrimary: LaRoche, Eugene R.Assistant: McCutcheon, Nathan W. Attorney, Agent or FirmInternational ClassesG01J 001/00G01N 021/81 AbstractA scanning system and method for optically measuring parameters such as dry basis weight, basis weight and moisture content of fibrous sheets during manufacture. The system includes a first track that extends generally parallel to one face of a traveling web in the cross direction; a stationary light source arranged to direct collimated light generally parallel to the first track; a first reflector that travels along the first track and focuses the collimated light against the adjacent face of the web; a second track that extends parallel to the first track adjacent the opposite face of the web; a second reflector that travels along the second track and collects and collimates rays that are transmitted through the web; and stationary light detectors that detect the intensity of the collected rays at least at two selected ranges of wavelengths to measure the absorption properties of the traveling web at selected locations. | |