U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method and apparatus for assessing surface roughness

Patent 4878114 Issued on October 31, 1989. Estimated Expiration Date: Icon_subject May 10, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3805035

Microfinish measurement apparatus and technique
Patent #: 4476489
Issued on: 10/09/1984
Inventor: Weltlich ,   et al.

Automatic surface inspection system
Patent #: 4513316
Issued on: 04/23/1985
Inventor: Kobayashi ,   et al.

Method and apparatus for automatic quantitative measurement of textures by image analysis
Patent #: 4617682
Issued on: 10/14/1986
Inventor: Mori ,   et al.

Electro-optical part inspection in the presence of contamination and surface finish variation Patent #: 4667231
Issued on: 05/19/1987
Inventor: Pryor

Inventors

Assignee

Application

No. 192699 filed on 05/10/1988

US Classes:

382/108, Surface texture or roughness measuring73/105, Roughness348/128, Of surface (e.g., texture or smoothness, etc.)382/168, HISTOGRAM PROCESSING702/167Contouring

Examiners

Primary: Peng, John K.

Attorney, Agent or Firm

International Classes

H04N 007/00
H04N 007/18

Abstract

A relatively low cost processor based optical system is used to carry out the method. An area of the surface whose roughness is to be assessed is illuminated by a light source, and a reflected light is directed to the lens of the video camera. The analog output of the video camera is digitized, and the digital signal is provided to a processor which performs an analysis to provide a parameter indicative of the roughness of the surface.

Other References

  • Luk F., Huynh V. and North W., "Measurement of Surface Roughness by a Vision System", Proc. of ASME Computers in Engineering, 1987 Conf., vol. 2, Aug. 9-13, 1987, pp. 61-65, (N.Y.)
  • F. Luk and V. Huynh, "Vision System for In-Process Surface Quality Assessment", Proceedings of Vision '87 Conf., Jun. 8-11, 1987, Detroit, MI., pp. 12-43 to 12-58
  • F. Luk, V. Huynh, W. North, "Application of Spatial Spectral Analysis to In-Line Machine Inspection of Surface Roughness", Proceedings of the IXth ICPR Conf., vol. I, Aug. 17-20, 1987, Cincinnati, Ohio, pp. 450 to 460
  • Van-Minh Huynh and William Hugh Miller, "A New Optical Method for the Measurement of Roughness of Paper Surfaces", Proceedings of the SID, vol. 28/84, 1987, pp. 471 to 47
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