Ultra-high-speed digital test system using electro-optic signal sampling
Patent 4875006 Issued on October 17, 1989. Estimated Expiration Date: 
September 1, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
September 1, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3614451 Electro-optical voltage measurement device Measurement of electrical signals with picosecond resolution Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits High speed testing of electronic circuits by electro-optic sampling Patent #: 4681449 InventorsApplicationNo. 239577 filed on 09/01/1988US Classes:324/97, Light beam type (e.g., mirror galvanometer, parallax-free scale)324/96, Using radiant energy324/753, Using electro-optic device356/368, With electro-optical light rotation359/257Pockel`s cellExaminersPrimary: Eisenzopf, Reinhard J.Assistant: Nguyen, Viet Q. Attorney, Agent or FirmInternational ClassesG01R 019/00G01R 005/28 AbstractA high-speed test system for semiconductor integrated circuits utilizes electro-optic sampling techniques to perform tests at data rates up to 1.2 Gb/s. The receiver portion of the tester has a 4.5 GHz bandwidth and can perform ECL level functional test with one sampling pulse per vector. A device under test is positioned in a test head with an electro-optic birefringent crystal sensor positioned below the device under test to minimize signal path length. A system control unit includes a Nd: YAG modelocked laser which generates optical pulses, and optical transmission means directs the optical pulses to an array of reflective contacts on the sensor. The sensor functions as a Pockels cell with the electric field in the crystal sensor due to voltages on the array of contacts changing the transmission of polarized light through the crystal. Reflected pulses are received and converted to electrical signals indicative of the voltages on the array of contacts on the electro-optic sensor.Other References
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