X-ray scanner with secondary radiation detector
Patent 4870670 Issued on September 26, 1989. Estimated Expiration Date: 
October 5, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
October 5, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3927318 Self-compensating X-ray or γ-ray thickness gauge Radiation scanning method and apparatus X-Ray line scan system for use in baggage inspection Multichannel radiography employing scattered radiation Patent #: 4495636 InventorAssigneeApplicationNo. 07/253484 filed on 10/05/1988US Classes:378/87, Imaging378/57, Inspection of closed container378/62, Imaging378/90Plural diverse X-ray analysisExaminersPrimary: Howell, Daniel W.Assistant: Porta, David P. Attorney, Agent or FirmInternational ClassesG01N 23/02 (20060101)G01V 5/00 (20060101) G01N 23/08 (20060101) Foreign Application Priority Data1987-10-19 DEAbstractAn article inspection system has separate detectors for primary radiation and scattered radiation which are generated by an article upon being irradiated with X-radiation. The scattered radiation detector is disposed so that no primary radiation is incident thereon. The primary radiation detector is scanned at a frequency to produce a primary radiation image. The scattered radiation incoming to the scattered radiation detector is modulated at a frequency synchronized with the scanning frequency for the primary radiation detector, so that only scattered radiation is incident on the scattered radiation detector which emanates from the region of the article which is currently being scanned for primary radiation.Other References
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