U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method and apparatus to determine the size and velocity of particles using light scatter detection from confocal beams

Patent 4854705 Issued on August 8, 1989. Estimated Expiration Date: Icon_subject April 5, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3915572

Measuring device for the measurement of fluid flow rates
Patent #: 3941477
Issued on: 03/02/1976
Inventor: Schodl

Electro-optical method and system for in situ measurements of particle size and distribution
Patent #: 4140395
Issued on: 02/20/1979
Inventor: Kreikebaum

Particle size analyzer
Patent #: 4179218
Issued on: 12/18/1979
Inventor: Erdmann ,   et al.

Apparatus for sizing particles, droplets or the like with laser scattering
Patent #: 4329054
Issued on: 05/11/1982
Inventor: Bachalo

Optical particle analyzers
Patent #: 4348111
Issued on: 09/07/1982
Inventor: Goulas ,   et al.

Particle size measuring method and apparatus
Patent #: 4387993
Issued on: 06/14/1983
Inventor: Adrian

Flat transmission cable connector and housing therefor
Patent #: 4444450
Issued on: 04/24/1984
Inventor: Huber

Measurement of the size of particles
Patent #: 4492467
Issued on: 01/08/1985
Inventor: Drain ,   et al.

Dual beam maximum intensity laser sizing system
Patent #: 4537507
Issued on: 08/27/1985
Inventor: Hess

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Inventor

Assignee

Application

No. 07/177630 filed on 04/05/1988

US Classes:

356/336, By particle light scattering356/338With photocell detection

Examiners

Primary: Willis, Davis L.
Assistant: Koren, Matthew W.

Attorney, Agent or Firm

International Class

G01N 15/02 (20060101)

Abstract

An apparatus for sizing particles, droplets, bubbles, or the like employing laser light scattering is disclosed. A laser is used for generating two beams of light having different wavelengths or polarizations. The beams with different wavelengths may be generated by an argon ion laser or by two different lasers (e.g., Helium Neon and Helium Cadmium). Two beams with orthogonal polarizations may be produced by partitioning a single linearly polarized beam and rotating the polarization of one by 90°. One of the beams is then expanded using a conventional beam expander and then redirected to be coaxial with the first beam. The beams are then focused to a common focal region. One beam is from two to four times larger in diameter than the other. An optical collection apparatus for sensing the light scattered caused by the particles, droplets, bubbles or the like passing through the focused beams has an axis extending into the focused beams. The axis of the collection apparatus may be aligned with the transmitted beams in the forward or backward direction (on-axis detection) or at some suitable angle to the beams (off-axis detection). The collection apparatus includes receiver lenses which focuses the scattered light through the beam splitter onto a first photo-detector, and light reflected from the beam splitter is directed onto a second photo-detector. The photo-detectors sense the scattered light from the beams with separate wavelengths or polarizations and produce proportionate voltage amplitudes. The peak voltages are determined from the information sensed by the light collection apparatus. A mathematical formulation is used with the known beam diameters and intensities along with the two measured signal voltage amplitudes to determine the particle trajectory through the beams and hence, particle size. The technique also allows for the determination of the sample volume cross-section and particle speed, thus allowing the determination of particle number density and volume flux.

Other References

  • Heterodyne and Quasi-Heterodyne Holographic Interferometry; Dandliker & Thalmann, 24 Opt. Eng. 824, (1985)
  • Heterodyne Holography Applications in Studies of Small Components, Pryputniewicz; 24 Opt. Eng. 849, (1985)
  • Phase/Doppler Spray Analyzer for Simultaneous Measurements of Drop Size and Velocity Distributions; Bachalo & Hauser; 23 Opt. Eng. 583, (1984)
  • Development of the Phase/Doppler Spray Analyzer for Liquid Drop Size and Velocity Characterizations; Bachalo & Houser; AIAA/SAE/ASME 20th Joint Propulsion Conf., (1984)
  • MIE and Refraction Theory Comparison for Particle Sizing with the Laser Velocimeter; Pendleton; 21 App. Opt. 684, (1982)
  • Method for Measuring the Size and Velocity of Spheres by Dual-Beam Light-Scatter Interferometry; Bachalo; 19 App. Opt. 363, (1980)
  • Particle Sizing Using Laser Interferometry; Roberds; 16 App. Opt. 1861, (1977)
  • Scattering from a Moving Spherical Particle by Two Crossed Coherent Plane Waves; Chu & Robinson; 16 App. Opt. 619, (1977)
  • Laser Doppler Measurements in Two-Phase Flows; Durst & Zare; Proc. of the LDA-Symposium Copenhagen 403, (1975)
  • Diffraction Analysis of Doppler Signal Characteristics for a Cross-Beam Laser Doppler Velocimeter; Robinson & Chu; 14 App. Opt. 2177, (1975)
  • High Resolution Hologram Interferometry by Electronic Phase Measurement; Dandliker, Ineichen & Mottier; 9 Opt. Comm. 412, (1973)
  • Interference Phase Measurement; Crane; 8 App. Opt. 538, (1969)
  • Heterodyne Holographic Interferometry; Dandliker; Progress in Optics, vol. XVII, (E. Wolf ed. 1980)
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