Method for evaluating smooth surfaces
Patent 4853777 Issued on August 1, 1989. Estimated Expiration Date: 
January 29, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
January 29, 2008. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesWindscreen angular deviation measurement device Adherable reinforced poly(ethylene terephthalate) composite sheet Microfinish measurement apparatus and technique Panel surface flaw inspection Apparatus for the inspection of continuous sheets of material Distortion inspection apparatus of a glass plate Patent #: 4647197 InventorAssigneeApplicationNo. 07/150136 filed on 01/29/1988US Classes:348/128, Of surface (e.g., texture or smoothness, etc.)356/613, Silhouette73/105RoughnessExaminersPrimary: Levy, Stuart S.Assistant: Raevis, Robert Attorney, Agent or FirmInternational ClassG01B 11/30 (20060101)AbstractThe short-term and long-term waviness of a smooth surface is determined quantitatively by a method which impinges light radiation onto the surface, detects the resultant light image, and mathematically processes that image. The method permits a fast, non-contact evaluation of a smooth surface with good correlation between the calculated values and the visual observation.Other References
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