U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Apparatus for, and method of, examining eyes

Patent 4838679 Issued on June 13, 1989. Estimated Expiration Date: Icon_subject June 13, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3832066

Method and apparatus for image construction
Patent #: 4173720
Issued on: 11/06/1979
Inventor: Geluk

Scanning ophthalmoscope for examining the fundus of the eye
Patent #: 4213678
Issued on: 07/22/1980
Inventor: Pomerantzeff ,   et al.

Integrated wavefront compensator Patent #: 4472029
Issued on: 09/18/1984
Inventor: Hardy

Inventor

Application

No. 06/706619 filed on 02/28/1985

US Classes:

351/205, Objective type351/206, Including eye photography351/221Including illuminator

Examiners

Primary: Bovernick, Rodney B.

Attorney, Agent or Firm

International Classes

A61B 3/107 (20060101)
A61B 3/12 (20060101)
A61B 3/117 (20060101)
A61B 5/00 (20060101)

Foreign Application Priority Data

1984-06-14 DE

Abstract

This invention enables comprehensive examinations of the front parts of human eyes, reliably provides precise and easily interpretable pictorial representations of the examination field, enables gentle examinations of short duration and is comparatively simple in construction and application. In this arrangement, a confocal arrangement of a pinhole relative to the focal plane of a microscope objective causes a scanning laser light bundle to be focused on the examination field. Use of a microscope objective for focusing the scanning light bundle enables a narrow limitation to be provided in the depth of the examination field. This light bundle may have a relatively wide cross section. Use of a pinhole to focus on a photodetector the light reflected from the eye causes a favorably high signal-to-noise ratio to be produced and image information data to be provided within minimal time intervals such as small fractions of a second to at most a few seconds. An electrically controllable active mirror operable within the beam-shaping optics of the scanning field may be included to displace the plane of the examination field relative to a median position. This active mirror may be controlled to operate as different types of mirrors including a plane mirror. Therefore, data for a high-resolution subdivision of an examination object into a plurality of thin layer-shaped examination fields may be obtained. Such data can be processed by an appropriate computer-controlled display unit and displayed by the unit as representations of the examination object along arbitrarily oriented and/or shaped sectional planes or curved areas.

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