U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Circuit and method for measuring and digitizing the value of a resistance

Patent 4814692 Issued on March 21, 1989. Estimated Expiration Date: Icon_subject December 22, 2007. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3660834

3786350

3810152

3875501

3875503

3895376

3918050

Automated calibration and standardization apparatus
Patent #: 3975727
Issued on: 08/17/1976
Inventor: Mader ,   et al.

Clocked precision integrating analog to digital converter system
Patent #: 4112428
Issued on: 09/05/1978
Inventor: Dorsman

Measuring apparatus providing separate analog and digital outputs
Patent #: 4117722
Issued on: 10/03/1978
Inventor: Helmstetter

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Inventor

Assignee

Application

No. 07/137022 filed on 12/22/1987

US Classes:

324/607, Including a conversion (e.g., A->D or D-> A) process324/704, With ratio determination324/711, Including R/C time constant circuit341/166Intermediate conversion to time interval

Examiners

Primary: Eisenzopf, Reinhard J.
Assistant: Solis, Jose M.

Attorney, Agent or Firm

International Classes

H03M 1/50 (20060101)
G01K 7/24 (20060101)
G01K 1/00 (20060101)
G01K 7/16 (20060101)
G01K 1/02 (20060101)
G01K 17/00 (20060101)

Foreign Application Priority Data

1984-09-06 CH

Abstract

The invention relates to a circuit and a method adapted for measuring and digitizing the value of a resistance. The circuit includes and A/D converter operating in accordance with a charge balancing principle, and a resistance network connected to the A/D converter so that the resistance is both a component of the A/D converter and of the resistance network. The A/D converter and the resistance network are interconnected in such a manner so as to permit only a purely resistive measurement. A processor is connected to the A/D converter for obtaining a composite measured resistance value from a plurality of individual measured resistance values. The method according to the invention permits accurate (or precise) resistance measurements having a high degree of resolution of an order of magnitude of 105 points. The method is applicable in particular for temperature measurements, for examples in calorimeters or in precision scales, but also in other resistance measurements.

Other References

  • Van De Plassche, "A Sigma-Delta Modulator as an A/D Converter", IEEE Transactions on Circuits and Systems, Jul. 1978 at 510
  • Jaeger and Daneshvar, "Design Limitations of Switched Capacitor Delta-Sigma ADCS", Proceedings of the Sixth Beinnial University/Government/Industry Microelectronics Symposium. Jun. 1985 at 152
  • Harrison, Hellworth and Jaeger, "Delta-Sigma A/D Conversion Can Save $$ In Slow-Speed Applications", EDN, vol. 18, No. 6, Mar. 20, 1973 at 78
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