Baggage inspection system
Patent 4783794 Issued on November 8, 1988. Estimated Expiration Date: 
July 17, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
July 17, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 1405233 2169483 2813617 3356205 3808444 3881605 Object orientation apparatus Device for positioning substrate wafers Container inspection system Radiographic examination system Patent #: 4599740 InventorAssigneeApplicationNo. 06/886362 filed on 07/17/1986US Classes:378/57, Inspection of closed container198/817, Separate, parallel conveying reaches supporting same load250/328, AUTOMATIC/SERIAL DETECTION OF SIMILAR SOURCES378/208, Object holder or support378/62ImagingExaminersPrimary: Church, Craig E.Assistant: Freeman, John C. Attorney, Agent or FirmInternational ClassesG01N 23/02 (20060101)G01N 23/04 (20060101) Foreign Application Priority Data1985-08-29 DEAbstractA baggage inspection system has a conveyor path disposed between an X-ray source, which genertes an X-ray beam, and a radiation detector for detecting radiation passing through articles on the conveyor path. The conveyor path is formed by two surfaces disposed at a right angle relative to each other, with the right angle being inclined relative to the horizontal so that articles on the conveyor path are forced by gravity to lie against one of the surfaces. At least one of the surfaces is a moveable surface, and the other surface may also be a moveable surface, or a roller surface or a plate against which the articles slide. The radiation detector may be an angled detector row so as to encompass substantially all of the radiation beam within its field of view.Other References
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