Patent ReferencesSystem for providing photomask alignment keys in semiconductor integrated circuit processing Method of manufacturing a semiconductor device Process for preparing a color proofing sheet Sequential automatic registration and imagewise exposure of a sheet substrate Process and composition for producing permanently water wettable surfaces Photoresist lift-off process for fabricating semiconductor devices Patent #: 4564584 InventorsAssigneeApplicationNo. 06/924737 filed on 10/30/1986US Classes:430/293, Color proofing or multicolor image formation430/22, REGISTRATION OR LAYOUT PROCESS OTHER THAN COLOR PROOFING430/7ColorExaminersPrimary: Brammer, Jack P.Attorney, Agent or FirmInternational ClassesG03F 7/00 (20060101)G03F 9/00 (20060101) Foreign Application Priority Data1985-11-06 JPAbstractA process for producing a color filter having plural number of colorant layer patterns by repeating, for each of a plural number of starting materials for colorant layer, the steps of subjecting a substrate having a photoresist laminated thereon to pattern exposure to effect patterning of said photo-resist, laminating a colorant layer from said photoresist above and removing the layer of said photoresist having said colorant layer laminated thereon by dissolution to form a colorant layer pattern, comprises forming an alignment mark on said substrate with the same starting material as a first colorant layer pattern simultaneously with formation of said first colorant layer pattern and performing registration of the mask during formation of a second colorant layer pattern et seq. through said alignment mark. |
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