Control for coordinate measuring instruments
Patent 4769763 Issued on September 6, 1988. Estimated Expiration Date: 
June 16, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 16, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3292495 Binary inspection probe for numerically controlled machine tools Adaptive path following motion control system for welding head assembly Tracer control system Coordinate measuring machine inspection and adjustment method Multicoordinate sensing head Method of measuring by coordinate measuring instrument and coordinate measuring instrument Patent #: 4653011 InventorsApplicationNo. 06/874696 filed on 06/16/1986US Classes:702/168, By probe (e.g., contact)33/503, Coordinate movable probe or machine33/504With computer responsive to contact probeExaminersPrimary: Lall, Parshotam S.Assistant: Mattson, Brian M. Attorney, Agent or FirmInternational ClassG05B 19/401 (20060101)Foreign Application Priority Data1985-06-28 DEAbstractA "scanning" work-contact probe is deflectable with respect to a measuring-machine head which is driven by the three-coordinate drive system of the measuring machine. The arrangement is such that the probe continuously tracks (scans) a desired profile of a workpiece and, in doing so, measured probe increments (decrements) of deflection with respect to the head are so mathematically combined with head-position data that, in the further circumstance of holding path-velocity magnitude |Vdes. | of the measuring machine to a constant value, the orientation of the probe head with respect to the locally contacted slope of the workpiece can also be a constant. | |
