Method for measuring the thickness and temperature of a moving metal sheet by means of eddy currents
Patent 4757259 Issued on July 12, 1988. Estimated Expiration Date: 
November 5, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
November 5, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2989691 3568050 3651398 3725778 3848466 Method for contactless measurement of conductivity and/or temperature on metals by means of eddy currents Temperature sensors with improved operating characteristics utilizing magnetic elements Method and an arrangement for inspecting the surface of steel stock having a temperature above the Curie point Patent #: 4534405 InventorAssigneeApplicationNo. 06/927089 filed on 11/05/1986US Classes:324/227, Plural tests324/229, Thickness measuring324/232Plural magnetic fields in materialExaminersPrimary: Eisenzopf, Reinhard J.Assistant: Edmonds, Warren S. Attorney, Agent or FirmInternational ClassesG01N 27/02 (20060101)G01B 7/02 (20060101) G01B 7/06 (20060101) G01K 7/36 (20060101) Foreign Application Priority Data1985-11-06 FRAbstractA non-contacting, eddy current, measuring method for determining the thickness and temperature of a moving metal sheet as in a metal rolling operation. Two separate magnetic fields are generated by applying two voltages of differing frequencies to a primary winding on one side of the sheet to induce two voltages in an opposed secondary winding on the other side of the sheet. The generated voltages are used to determine the calibration constants required to calculate the thickness and temperature of the moving sheet.Field of SearchCalibrationCurie point determination Fluid material examination Movable random length material measurement With temperature control of material or element of test circuit With compensation for test variable Combined Plural tests With means to create magnetic field to test material Thickness measuring Layer or layered material With backing member Plural magnetic fields in material With phase sensitive element Induced voltage-type sensor Material flaw testing Opposed induced voltage sensors Plural sensors Plural sensors | |
