U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Eddy current surface mapping system for flaw detection

Patent 4755753 Issued on July 5, 1988. Estimated Expiration Date: Icon_subject July 23, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3302105

3475681

3737764

3826132

Method and apparatus for producing metal blanks, in particular steel slabs, which at least in a predetermined surface area have substantially no defects
Patent #: 4126491
Issued on: 11/21/1978
Inventor: Karlsson

Method for generating the eddy current signature of a flaw in a tube proximate a contiguous member which obscures the flaw signal
Patent #: 4194149
Issued on: 03/18/1980
Inventor: Holt ,   et al.

Automatic sensitivity adjustment apparatus for calibration of a non-destructive inspection instrument
Patent #: 4247818
Issued on: 01/27/1981
Inventor: Hiroshima ,   et al.

Dual trace automatic eddy current detection system for multilayer structures
Patent #: 4268791
Issued on: 05/19/1981
Inventor: Rogel ,   et al.

Control apparatus for eddy current non-destructive testing using a digital compensating circuit
Patent #: 4322683
Issued on: 03/30/1982
Inventor: Vieira ,   et al.

Eddy current test apparatus for annular welds
Patent #: 4337431
Issued on: 06/29/1982
Inventor: Hale

More ...

Inventor

Assignee

Application

No. 06/887303 filed on 07/23/1986

US Classes:

324/237, Material flaw testing324/240, Material flaw testing324/243Plural sensors

Examiners

Primary: Eisenzopf, Reinhard J.
Assistant: Edmonds, Warren S.

Attorney, Agent or Firm

International Class

G01N 27/90 (20060101)

Abstract

A system and method for nondestructive testing of a part using eddy current impedance measuring techniques. An eddy current probe is positioned above the surface of the part for measuring an induced eddy current signal and generating an electrical signal representative thereof. A first and second movement signal is generated representative of a first and second scan direction of the probe. Relative movement is effected between the probe and the part, whereby the probe scans the part for producing electrical signals varying as a function of eddy current signal. The electrical signals are converted to mutually perpendicular drive signals representative of the eddy current signature at a corresponding location of the part. The first and second movement signals are combined with the mutually perpendicular drive signals of and second composite signal which varies as a function of the movement of the probe and eddy current signal. The first and second composite signals are applied to a display means for generating a three-dimensional image representative of irregularities in the part.

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