Patent References 3302105 3475681 3737764 3826132 Method and apparatus for producing metal blanks, in particular steel slabs, which at least in a predetermined surface area have substantially no defects Method for generating the eddy current signature of a flaw in a tube proximate a contiguous member which obscures the flaw signal Automatic sensitivity adjustment apparatus for calibration of a non-destructive inspection instrument Dual trace automatic eddy current detection system for multilayer structures Control apparatus for eddy current non-destructive testing using a digital compensating circuit Eddy current test apparatus for annular welds InventorAssigneeApplicationNo. 06/887303 filed on 07/23/1986US Classes:324/237, Material flaw testing324/240, Material flaw testing324/243Plural sensorsExaminersPrimary: Eisenzopf, Reinhard J.Assistant: Edmonds, Warren S. Attorney, Agent or FirmInternational ClassG01N 27/90 (20060101)AbstractA system and method for nondestructive testing of a part using eddy current impedance measuring techniques. An eddy current probe is positioned above the surface of the part for measuring an induced eddy current signal and generating an electrical signal representative thereof. A first and second movement signal is generated representative of a first and second scan direction of the probe. Relative movement is effected between the probe and the part, whereby the probe scans the part for producing electrical signals varying as a function of eddy current signal. The electrical signals are converted to mutually perpendicular drive signals representative of the eddy current signature at a corresponding location of the part. The first and second movement signals are combined with the mutually perpendicular drive signals of and second composite signal which varies as a function of the movement of the probe and eddy current signal. The first and second composite signals are applied to a display means for generating a three-dimensional image representative of irregularities in the part.Field of SearchWith phase sensitive elementOscillator type Material flaw testing Material flaw testing Induced voltage-type sensor Material flaw testing Opposed induced voltage sensors Plural sensors Plural sensors Combined With compensation for test variable Magnetic field detection devices With support for article Magnetic test structure elements With means to create magnetic field to test material Current through test material forms test magnetic field | |