U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Surface mensuration sensor

Patent 4737032 Issued on April 12, 1988. Estimated Expiration Date: Icon_subject August 26, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3796492

3918816

Gauging surfaces by remotely tracking multiple images
Patent #: 3986774
Issued on: 10/19/1976
Inventor: Lowrey, Jr. ,   et al.

Recording images of a three-dimensional surface by focusing on a plane of light irradiating the surface
Patent #: 4238147
Issued on: 12/09/1980
Inventor: Stern

Apparatus for measuring contour configuration of articles
Patent #: 4297034
Issued on: 10/27/1981
Inventor: Ito ,   et al.

Examining a gemstone
Patent #: 4529305
Issued on: 07/16/1985
Inventor: Welford ,   et al.

Arrangement of eliminating erroneous data in three-dimensional optical sensors
Patent #: 4529316
Issued on: 07/16/1985
Inventor: DiMatteo

Method for measuring the transverse profile of the head of a rail of a railroad track
Patent #: 4531837
Issued on: 07/30/1985
Inventor: Panetti

Method and apparatus for automatic alignment Patent #: 4563094
Issued on: 01/07/1986
Inventor: Yamada

Inventors

Application

No. 06/769442 filed on 08/26/1985

US Classes:

356/606Line of light projected

Examiners

Primary: Evans, F. L.

Attorney, Agent or Firm

International Classes

G01B 11/25 (20060101)
G01B 11/24 (20060101)
G05B 19/42 (20060101)

Abstract

The invention is an apparatus having an improved arrangement of sensing and illumination elements for high speed, non-contact, three-dimensional mensuration of a surface. The surface is illuminated by a single plane of light producing a contour line. The line is viewed from two or more vantage points, alleviating shadowing from many types of large surface irregularities. The geometry of the apparatus is tolerant of moving surfaces, allows higher data rates and has great depth of field for the sensor.

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