High frequency response multilayer heat flux gauge configuration
Patent 4722609 Issued on February 2, 1988. Estimated Expiration Date: 
May 28, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
May 28, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 2334969 2740899 3188594 3605490 3887785 High energy sensor Platinum film resistor device Individual gauge for the microclimate index Thin film resistance thermometer device with a predetermined temperature coefficent of resistance and its method of manufacture Thermopile type detector with temperature sensor for cold junction InventorsApplicationNo. 06/738217 filed on 05/28/1985US Classes:374/30, By differential temperature measurement along undisturbed thermal gradient250/252.1, CALIBRATION OR STANDARDIZATION METHODS338/25, Ambient temperature374/185Detail of resistive sensorExaminersPrimary: Yasich, Daniel M.Attorney, Agent or FirmInternational ClassesG01K 17/20 (20060101)G01K 17/00 (20060101) AbstractDouble-sided, high-frequency response heat flux gauge for use on metal turbine blading consists of a metal film (1500A) resistance thermometer sputtered on both sides of a thin (25 μm) polyimide sheet. The temperature difference across the polyimide is a direct measure of the heat flux at low frequencies, while a quasi-ID analysis is used to infer the high-frequency heat flux from the upper surface history.Other References
| |
