Inspection apparatus
Patent 4715228 Issued on December 29, 1987. Estimated Expiration Date: 
August 27, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
August 27, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References3824843 InventorsAssigneeApplicationNo. 06/900694 filed on 08/27/1986US Classes:73/640, Scanning curved surface in direction of curvature73/583Of aircraft or related structural elementExaminersPrimary: Levy, Stuart S.Assistant: Arana, Louis Attorney, Agent or FirmInternational ClassesG01D 11/30 (20060101)G01D 11/00 (20060101) Foreign Application Priority Data1985-10-09 GBAbstractIt is common practice to pass an ultrasonic probe over a workpiece so as to enable examining of the material for faults such as flaws within the material thickness. Known apparatus for achieving this has a drawback in that the probe supporting structure is such that the probe oscillates about some point within its length, as the structure passes over curved or undulating surfaces. Control over the position of the focal point is thus lost. The invention involves ensuring that the pivot point of the probe coincides with its focal point which in turn enables control of the position of the focal point to be maintained. | |
