Dual shear wavefront sensor
Patent 4696573 Issued on September 29, 1987. Estimated Expiration Date: 
July 3, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
July 3, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3829219 3921080 3923400 Sensor system for detecting wavefront distortion in a return beam of light Combined shearing interferometer and Hartmann wavefront sensor Patent #: 4518854 InventorAssigneeApplicationNo. 06/751633 filed on 07/03/1985US Classes:356/521, Having wavefront division (by diffraction)250/201.9, Light beam wavefront phase adaptation356/520, Having shearing702/1, MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT702/127MEASUREMENT SYSTEMExaminersPrimary: Willis, Davis L.Assistant: Koren, Matthew W. Attorney, Agent or FirmInternational ClassesG01J 9/02 (20060101)G01J 9/00 (20060101) AbstractA wavefront of light is focused upon a first shearing interferometer having a relatively large shear and small dynamic range and a relatively minor portion of the light is focused upon a second shearing interferometer having a relatively small shear but large dynamic range. Owing to the limited dynamic range of the first shearing interferometer a plurality of a plurality of virtual candidate measurements are manifest which are compared with the temporally and/or spatially averaged values of each measurement produced by the second shearing interferometer and the closest match is employed to obtain a highly accurate unambiguous reading of the wavefront slope measurements. | |
