U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Acoustic microscopy

Patent 4694699 Issued on September 22, 1987. Estimated Expiration Date: Icon_subject June 30, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

2485722

Diffraction electroacoustic transducer
Patent #: 4075516
Issued on: 02/21/1978
Inventor: Hattori ,   et al.

Piezoelectric array using parallel connected elements to form groups which groups are .apprxeq.1/2λ in width
Patent #: 4305014
Issued on: 12/08/1981
Inventor: Borburgh ,   et al.

Conical transducer ultrasonic scanning
Patent #: 4325258
Issued on: 04/20/1982
Inventor: Foster

Multi-focus spiral ultrasonic transducer
Patent #: 4401910
Issued on: 08/30/1983
Inventor: Beerman

Ultrasonic microscope
Patent #: 4510810
Issued on: 04/16/1985
Inventor: Kanda ,   et al.

Method for measurement of velocity of surface acoustic wave
Patent #: 4524621
Issued on: 06/25/1985
Inventor: Yamanaka

Ultrasonic microscope system
Patent #: 4541281
Issued on: 09/17/1985
Inventor: Chubachi ,   et al.

Method for representing elastic parameters of object surfaces Patent #: 4603585
Issued on: 08/05/1986
Inventor: Atalar

Inventor

Assignee

Application

No. 06/880664 filed on 06/30/1986

US Classes:

73/606Imaging of discontinuity with stationary sonic transmitter

Examiners

Primary: Ciarlante, Anthony V.

Attorney, Agent or Firm

International Classes

B06B 1/06 (20060101)
G01N 29/06 (20060101)
G01S 15/00 (20060101)
G01S 15/89 (20060101)

Abstract

The present invention relates to a method and apparatus for providing a magnified image of a zone of a specimen. The method comprises the steps of generating acoustic waves having different frequencies and focussing on the zone the acoustic waves wherein different points on the zone receive and reflect acoustic waves having different frequencies, the frequency of a wave received by a given point being function of the position of the point in the zone. The method further comprises the steps of analyzing the reflected waves to generate signals representative of the physical structure of the zone at the points and establishing a correspondance between the signals and the positions of the points in the zone from the frequencies of the reflected waves and, forming from the signals a magnified representation on a display of the physical structure of the zone to construct an image of the zone. The invention also relates to the use of the same technique to obtain quantitative information on the acoustic properties of specimens on a microscopic scale. These properties, which include sound velocity and attenuation as a function of position, direction and frequency can be derived directly from the property of different emitted frequencies corresponding to different positions in the lens assembly. This property can also be used to obtain images for different incidence angles either independently or in any desired combination.

Other References

  • Recent Advances in High Resolution Acoustic Microscopy, Mehrdad Nikoonahad, Contemp. Phys., 1984, vol. 25, No. 2, pp. 129-158
  • Mechanically Scanned Acoustic Microscope, Noriyoshi Chubachi, Proceedings of 2nd Symposium on Ultrasonic Electronics, Tokyo 1981, Japanese Journal of Applied Physics, vol. 21 (1982) Supplemental 21-23, pp. 7-10
  • The Acoustic Microscope, Calvin F. Quate
  • La Microscopie Acoustique, Jacques Attal
  • Ultrasonic Imaging, vol. 1, No. 1, 1979, "The Wedged Transducer-A Transducer Design for Broad Band Characteristics", Gerard A. Alphonse, RCA Laboratories, Princeton, NJ
  • The Elsam Acoustic Microscope, A. Thaer, M. Hoppe, and W. J. Patzelt, Sonderdruck aus Leitz Mittellungen fur Wissenschaft u. Technik, vol. VIII, No. 3/4-1982, engl. pp. 61-67
  • Scanning Acoustic Microscopy, Enlightened New Technique Gives In-Depth Material Analysis, J. David Cheeke, Canadian Research, Sep. 1985
  • Ultrasonic Micro-Spectroscopy via Rayleigh Waves, N. Chubachi, Symposium on Rayleigh Wave Theory and Application, ed. E. A. Ash and E. G. S. Paige, Springer-Verlay 1985
  • Weaver et al, IEEE Trans. SU-32, 302, 1985
  • Spectroscopic Examination of Thin Film Overlays, Lee, Tsai and Cheng IEEE Trans., SU-32,248, 1985
  • Poirier Neron, Castonguay and Cheeke JAP 55,89, 1984
  • G. S. Kino, Special Issue on Acoustic Imaging, Proceedings of the IEEE, 67,510, Apr. 1979
  • Bertoni IEEE Trans SU-31,105, 1984
  • Breazale et al, Jour. App. Phys. 48,530, 1977
  • Neubauer and Dragonette, JAP, 45,618, 1974
  • Mayer et al. JAP, 50, (12) 1979
  • Acoustic Micro-Metrology, Rolf D. Weglein, IEEE Transactions on Sonics and Ultrasonics, vol. SU-32, No. 2, Mar. 1985
  • Scanning Acoustic Microscopy Using PVDF Concave Lenses, Electronics Letters, 10th Oct. 1985, vol. 21, No. 21, pp. 990-992
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