Method for measuring damage to structural components
Patent 4677855 Issued on July 7, 1987. Estimated Expiration Date: 
December 19, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
December 19, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent ReferencesSpecimen crack stress intensity control loop for test device Method and apparatus for determining the time dependency of the length of a fissure in a test specimen during a fracture test Pipeline monitoring system Patent #: 4452087 InventorsApplicationNo. 06/810628 filed on 12/19/1985US Classes:73/799Specimen cracking or crack propagationExaminersPrimary: Levy, Stuart S.Assistant: Raevis, Robert Attorney, Agent or FirmInternational ClassG01N 27/20 (20060101)AbstractA method is provided for measuring crack growth within a material utilizing reversing d.c. potential measurements across a preformed crack. Preferably, the material is representative of structural components of interest and the material is located within the aggressive environment of such components. The measured values are plotted versus distance to obtain intercept values. These intercept values correspond to the depth of the crack at the time the measured values were obtained.Other References
| |
