U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

X-ray image scanner and method

Patent 4672454 Issued on June 9, 1987. Estimated Expiration Date: Icon_subject December 4, 2004. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3696520

Solid state imaging device
Patent #: 4067046
Issued on: 01/03/1978
Inventor: Nakatani ,   et al.

Intraoral fluoroscope
Patent #: 4160997
Issued on: 07/10/1979
Inventor: Schwartz

Amorphous semiconductors equivalent to crystalline semiconductors produced by a glow discharge process
Patent #: 4226898
Issued on: 10/07/1980
Inventor: Ovshinsky ,   et al.

Light and particle image intensifier
Patent #: 4471378
Issued on: 09/11/1984
Inventor: Ng

Photosensor array wherein each photosensor comprises a plurality of amorphous silicon p-i-n diodes Patent #: 4482804
Issued on: 11/13/1984
Inventor: Oritsuki ,   et al.

Inventors

Assignee

Application

No. 06/678105 filed on 12/04/1984

US Classes:

378/98.8, With solid-state image detector250/370.09, X-ray or gamma-ray system250/370.11, Scintillation system257/E27.141, Imager using a photoconductor layer (e.g., single photoconductor layer for all pixels) (EPO)257/E27.147, Contact-type imager (e.g., contacts document surface) (EPO)348/309, Exclusively passive light responsive elements in the matrix378/98.2Televison

Examiners

Primary: Rubinson, Gene Z.
Assistant: Brinich, Stephen

Attorney, Agent or Firm

International Classes

H04N 1/028 (20060101)
H01L 27/146 (20060101)

Abstract

An apparatus for providing electrical signals representative of an image formed by X-rays projected thereon includes a two-dimensional array of spaced apart light sensitive sensors formed from deposited semiconductor material. The elements are capable of effecting a detectable electrical characteristic responsive to the intensity of light received thereon. A phosphorescent layer overlying the light sensitive elements receives the projected X-ray image and produces light in response to the impingement of the X-rays thereon. Isolation elements enable the selective addressing of the light sensitive elements. A method of converting an image from electromagnetic energy to a plurality of electrical signals is also disclosed.

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