Calibration method for an optical measuring system employing reference grids in a series of reference planes
Patent 4670659 Issued on June 2, 1987. Estimated Expiration Date: 
June 2, 2004. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.
June 2, 2004. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.Patent References 3762818 3902811 InventorAssigneeApplicationNo. 06/591484 filed on 05/17/1984US Classes:250/559.04, Evaluation by regions, zones, or pixels250/559.1, With calibration250/559.24, Transversal measurement (e.g., width, diameter, cross-sectional area)250/559.27, Thickness702/97Length, distance, or thicknessExaminersPrimary: Nelms, David C.Assistant: Allen, S. Attorney, Agent or FirmInternational ClassesG01B 11/04 (20060101)G01B 11/02 (20060101) G01B 11/06 (20060101) Foreign Application Priority Data1979-11-26 GBAbstractThe invention proposes an electro-optical measurement system to be used to measure the width and possibly also the thickness of a strip 14 being rolled. The strip is imaged onto an electro-optical transducer each of which views the whole width of the strip. To compensate for inaccuracies resulting from the imaging system, a calibration of the imaging system is effected by means of a grid of known dimensions. The calibration results are recorded during a setting up process and used by a digital or analogue computer to correct any measurements taken by the imaging system during operation. There is also disclosed an improved technique for edge detection and for processing video data in real time. | |
