U.S. patents available from 1976 to present.
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Method of making multilayer ohmic contact to thin film p-type II-VI semiconductor

Patent 4666569 Issued on May 19, 1987. Estimated Expiration Date: Icon_subject June 2, 2006. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3268309

3370207

3465428

Ohmic contacts to p-type mercury cadmium telluride
Patent #: 4000508
Issued on: 12/28/1976
Inventor: Hager ,   et al.

Insulated-gate thin film transistor with low leakage current
Patent #: 4065781
Issued on: 12/27/1977
Inventor: Gutknecht

Ohmic contacts to p-type mercury cadmium telluride
Patent #: 4085500
Issued on: 04/25/1978
Inventor: Hager, et al.

Thin film heterojunction photovoltaic cells and methods of making the same
Patent #: 4388483
Issued on: 06/14/1983
Inventor: Basol ,   et al.

Method of forming ohmic contacts
Patent #: 4456630
Issued on: 06/26/1984
Inventor: Basol

Cadmium sulphide solar cell Patent #: 4463215
Issued on: 07/31/1984
Inventor: Bassett ,   et al.

Inventor

Assignee

Application

No. 06/869545 filed on 06/02/1986

US Classes:

438/603, II-VI compound semiconductor136/256, Contact, coating, or surface geometry136/260, Cadmium containing136/264, Selenium or tellurium containing205/157, Coating predominantly semiconductor substrate (e.g., silicon, compound semiconductor, etc.)257/E21.478, From gas or vapor, e.g., condensation (EPO)257/E21.479, From liquid, e.g., electrolytic deposition (EPO)257/E29.143, Ohmic electrodes (EPO)438/95, Chalcogen (i.e., oxygen (O), sulfur (S), selenium (Se), tellurium (Te)) containing438/98Contact formation (i.e., metallization)

Examiners

Primary: Weisstuch, Aaron

Attorney, Agent or Firm

International Classes

H01L 29/40 (20060101)
H01L 21/02 (20060101)
H01L 21/443 (20060101)
H01L 21/445 (20060101)
H01L 29/45 (20060101)

Abstract

A method of making an ohmic content to a thin film of a II-VI compound semiconductor. The contact is made by etching the film with an acidic solution and thereafter treating the etched surface with an alkaline solution. A layer of copper 5 to 50 angstroms thick is deposited on the etched and treated surface and covered by a different metal. The contact may be heat treated to improve its performance.

Other References

  • H Jaeger et al, J. Electronic Mat'ls, vol. 10, No. 3, May 1981, pp. 605-618
  • NASA Tech. Briefs, Winter 1977, p. 433
  • Boer et al., "P-Type Photoelectric Behavior in CdS Dominated by a High Resistivity Region Near the Anode" Phys. Rev., vol. 154, pp. 757-762 (1967)
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