U.S. patents available from 1976 to present.
U.S. patent applications available from 2005 to present.

Method of measuring by coordinate measuring instrument and coordinate measuring instrument

Patent 4653011 Issued on March 24, 1987. Estimated Expiration Date: Icon_subject March 27, 2005. Estimated Expiration Date is calculated based on simple USPTO term provisions. It does not account for terminal disclaimers, term adjustments, failure to pay maintenance fees, or other factors which might affect the term of a patent.

Patent References

3727119

3840993

Portal-type precision measuring apparatus
Patent #: 4138822
Issued on: 02/13/1979
Inventor: Parodi

Method and apparatus for use in co-ordinate measuring machines
Patent #: 4168576
Issued on: 09/25/1979
Inventor: McMurtry

Positional reference system for ultraprecision machining
Patent #: 4365301
Issued on: 12/21/1982
Inventor: Arnold ,   et al.

Tool touch probe system and method of precision machining
Patent #: 4428055
Issued on: 01/24/1984
Inventor: Zurbrick ,   et al.

Coordinate measuring machine inspection and adjustment method
Patent #: 4437151
Issued on: 03/13/1984
Inventor: Hurt ,   et al.

Dimensional measurement system served by a plurality of operating arms and controlled by a computer system
Patent #: 4484293
Issued on: 11/20/1984
Inventor: Minucciani ,   et al.

Device and method for determining the location and orientation of a drillhole Patent #: 4485453
Issued on: 11/27/1984
Inventor: Taylor

Inventor

Application

No. 06/716717 filed on 03/27/1985

US Classes:

700/258, Having particular sensor33/503, Coordinate movable probe or machine33/504, With computer responsive to contact probe702/155, Dimensional determination702/168, By probe (e.g., contact)901/44, Inspection901/46SENSING DEVICE

Examiners

Primary: Ruggiero, Joseph

Attorney, Agent or Firm

International Classes

G05B 19/427 (20060101)
G01B 7/008 (20060101)

Foreign Application Priority Data

1984-10-29 JP

Abstract

This invention relates to a method of measuring by a coordinate measuring instrument and the coordinate measuring instrument, wherein a probe to be brought into abutting contact with a work to be measured is moved in two- or tri-dimensional direction by a robot mechanism provided independently of a main body of measuring instrument. A moving path of the robot mechanism is preset, and, when a command to carry out a predetermined measuring program is given from a data processing unit, the robot mechanism is moved in accordance with the moving path, and a measured result is calculated to seek a dimension of the work, on the basis of measured data given through an abutting contact between the probe and the work.

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